Cart (Loading....) | Create Account
Close category search window
 

Structured Light Fringe Projection Setup Using Optimized Acousto-Optic Deflectors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Dupont, S.H. ; Univ. Lille Nord de France, Lille, France ; Kastelik, J.-C. ; Pommeray, M.

This paper presents a tunable multistripe structured light projection setup employing a pair of in-house-developed high-efficiency acousto-optic deflectors (AODs). The system is tunable over a wide bandwidth of spatial frequencies of the stripes patterns. The setup is achieving a symmetric beam deflection around the optical axis of the projector without the use of additional optics thanks to a prismatic design of the deflectors. The AODs are based on tangential phase-matching, high-frequency anisotropic interaction in paratellurite ( TeO2). The use of such optimized AODs leads to a simple experimental configuration with increased dynamical characteristics of the stripes period; this feature is very useful for 3-D image reconstruction.

Published in:

Mechatronics, IEEE/ASME Transactions on  (Volume:15 ,  Issue: 4 )

Date of Publication:

Aug. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.