By Topic

18.3: Klystron lifetime and reliability analysis: Five year update

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Balkcum, A. ; Commun. & Power Ind., Inc., Palo Alto, CA, USA

Repair histories for over 1,000 klystrons of four fundamentally different design types and applications continue to be monitored. Statistical analysis of the failure data accumulated over nearly twenty years indicate mean time between failure values at the 90% confidence level ranging from 17 to 39 field service years for these devices. Comparison to the previous values indicates that the product lifetimes continue to improve.

Published in:

Vacuum Electronics Conference (IVEC), 2010 IEEE International

Date of Conference:

18-20 May 2010