IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > Lasers and Electro-Optics (CL ... Help

High-Q silica microsphere by poly(methyl methacrylate) coating and modifying

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Dong, C.-H. ; Key Lab. of Quantum Inf., Univ. of Sci. & Technol. of China, Hefei, China ; Sun, F.-W. ; Zou, C.-L. ; Guo, G.C.
more authors

We experimentally characterize the Q-factor (>108) in silica microsphere by the PMMA coating. The Q-factor of microsphere with deposited QDs is increased after the coating which draws the maximal field outside and increases the interaction.

Published in:
Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010 Conference on

Date of Conference: 16-21 May 2010

Page(s):
1 - 2
E-ISBN :
978-1-55752-890-2
Print ISBN:
978-1-55752-890-2
INSPEC Accession Number:
11411365
Conference Location :
San Jose, CA
Product Type:
Conference Publications

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.