Close category search window
 

A sparsity-driven joint image registration and change detection technique for SAR imagery

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Nguyen, L.H. ; U.S. Army Res. Lab., Adelphi, MD, USA ; Tran, T.D.

This paper presents a novel Sparsity-driven joint Image REgistration and Change Detection (SIRE-CD) technique for SAR imagery. The proposed algorithm simultaneously performs two main tasks: (i) locally register the test and reference images; and (ii) perform the change detection between the two. The key innovative concept here is the sparsity-driven transformation of the signatures from the reference image to match to those of the test image at the local image patch level. In other words, we are constructing a large dictionary from the reference data and use that to find the sparsest representation that best approximates the new incoming test data. The accuracy level of the approximation determines the detected changes between the reference and the test image. We demonstrate the performance of this technique using both simulated data and real SAR imagery from the Army Research Laboratory ultra-wideband (UWB) SAR forward-looking radar.

Published in:
Acoustics Speech and Signal Processing (ICASSP), 2010 IEEE International Conference on

Date of Conference: 14-19 March 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.