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Deterministic built-in self-test using multiple linear feedback shift registers for test power and test volume reduction

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3 Author(s)
Tseng, W.-D. ; Dept. of Comput. Sci. & Eng., Yuan Ze Univ., Chungli, Taiwan ; Lee, L.-J. ; Lin, R.-B.

Large test data volume and excessive test power are two strict challenges for very large-scale integration testing. This study presents a deterministic built-in self-test scheme using variable-length multiple linear feedback shift registers to generate the compressed low power test set. The experimental results show that both test power and test application time can be reduced significantly.

Published in:

Computers & Digital Techniques, IET  (Volume:4 ,  Issue: 4 )