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A model for electrical tree growth in solid insulating materials using cellular automata

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4 Author(s)
Danikas, M.G. ; Dept. of Electr. & Comput. Eng., Democritus Univ. of Thrace, Xanthi, Greece ; Karafyllidis, I. ; Thanailakis, A. ; Bruning, A.M.

Models proposed to explain the breakdown mechanisms of the solid insulating materials are based, among others, on electromagnetic theory, avalanche theory and fractals. In this paper the breakdown of insulating materials is simulated using von Neumann's Cellular Automata (CAs). An algorithm for solid dielectric breakdown simulation based on CAs is presented with a point/plane electrode arrangement. The algorithm is also used to simulate breakdown in a solid dielectric having a spherical void

Published in:
Electrical Insulation, 1996., Conference Record of the 1996 IEEE International Symposium on  (Volume:2 )

Date of Conference: 16-19 Jun 1996

Page(s):
887 - 890 vol.2
Meeting Date :
16 Jun 1996-19 Jun 1996
ISSN :
1089-084X
Print ISBN:
0-7803-3531-7
INSPEC Accession Number:
5464652
Conference Location :
Montreal, Que.
Digital Object Identifier :
10.1109/ELINSL.1996.549484
Product Type:
Conference Publications

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