By Topic

Fine-Grained Profiling for Data-Intensive Workflows

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Nan Dun ; Dept. of Comput. Sci., Univ. of Tokyo, Tokyo, Japan ; Taura, K. ; Yonezawa, A.

Profiling is an effective dynamic analysis approach to investigate complex applications. ParaTrac is a user-level profiler using file system and process tracing techniques for data-intensive workflow applications. In two respects ParaTrac helps users refine the orchestration of workflows. First, the profiles of I/O characteristics enable users to quickly identify bottlenecks of underlying I/O subsystems. Second, ParaTrac can exploit fine-grained data-processes interactions in workflow execution to help users understand, characterize, and manage realistic data-intensive workflows. Experiments on thoroughly profiling Montage workflow demonstrate that ParaTrac is scalable to tracing events of thousands of processes and effective in guiding fine-grained workflow scheduling or workflow management systems improvements.

Published in:

Cluster, Cloud and Grid Computing (CCGrid), 2010 10th IEEE/ACM International Conference on

Date of Conference:

17-20 May 2010