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A Novel Tungsten–Nickel Alloy Ohmic Contact to SiC at 900 ^{\circ}\hbox {C}

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4 Author(s)
Okojie, R.S. ; NASA Glenn Res. Center, Cleveland, OH, USA ; Evans, L.J. ; Lukco, D. ; Morris, J.P.

A novel tungsten-nickel ohmic contact metallization on 4H-SiC and 6H-SiC capable of surviving temperatures as high as 900°C is reported. Preliminary results revealed the following: (1) ohmic contact on n-type 4H-SiC having net doping levels (Nd's) of 1.4 and 2 × 1019 cm-3, with specific contact resistances ρsNd's of 7.69 × 10-4 and 5.81 × 10-4 Ω · cm2, respectively, after rapid thermal annealing (RTA), and 5.9 × 10-3 and 2.51 × 10-4 Ω · cm2, respectively, after subsequent soak at 900°C for 1 h in argon, and (2) ohmic contact on n- and p-type 6H-SiC having Nd > 2 × 1019 and Nα > 1 × 1020 cm-3, with ρsNd = 5 × 10-5 and ρsNa = 2 × 10-4 Ω · cm2, respectively, after RTA, and ρSNd = 2.5 × 10-5 and ρSNa = 1.5 × 10-4 Ω · cm2 after subsequent treatment at 900°C for 1 h in argon, respectively.

Published in:
Electron Device Letters, IEEE  (Volume:31 ,  Issue: 8 )

Date of Publication: Aug. 2010

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