A Novel Tungsten–Nickel Alloy Ohmic Contact to SiC at 900
A novel tungsten-nickel ohmic contact metallization on 4H-SiC and 6H-SiC capable of surviving temperatures as high as 900°C is reported. Preliminary results revealed the following: (1) ohmic contact on n-type 4H-SiC having net doping levels (Nd's) of 1.4 and 2 × 1019 cm-3, with specific contact resistances ρsNd's of 7.69 × 10-4 and 5.81 × 10-4 Ω · cm2, respectively, after rapid thermal annealing (RTA), and 5.9 × 10-3 and 2.51 × 10-4 Ω · cm2, respectively, after subsequent soak at 900°C for 1 h in argon, and (2) ohmic contact on n- and p-type 6H-SiC having Nd > 2 × 1019 and Nα > 1 × 1020 cm-3, with ρsNd = 5 × 10-5 and ρsNa = 2 × 10-4 Ω · cm2, respectively, after RTA, and ρSNd = 2.5 × 10-5 and ρSNa = 1.5 × 10-4 Ω · cm2 after subsequent treatment at 900°C for 1 h in argon, respectively.
Published in:
Electron Device Letters, IEEE
(Volume:31
,
Issue:
8
)
Date of Publication: Aug. 2010