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This work aims to obtain the well-implemented measuring system to characterize particle of sizes ranged from 200-600 nm, type of SiO2 , on surface of Lubricant (nD20) recording media , at 635 nm of wavelength of incident light. The system has an incident and reflective angles at 89 which is based on the principle of Mie scattering theory . Moreover, the intensities of scattered light from simulations based on BRDFpart  are compared to the results of experiments from David W. Hahn . For the conclusion, the system based on our design will be implemented to measure the particle sizes and types accurately and efficiently.