Cart (Loading....) | Create Account
Close category search window
 

Obtaining highly localized edges using phase congruency and ridge detection

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Făgădar-Cosma, M. ; Dept. of Comput. Sci. & Eng., Politeh. Univ. of Timisoara, Timisoara, Romania ; Micea, M.V. ; Cretu, V.

Edge localization is an important factor when choosing between various image feature extraction techniques. Lesser edge displacement means more accurate results, and this is the aim of most edge detectors. We present a novel algorithm for obtaining highly localized edges from grayscale images, based on an analogy between phase congruency maps and digital elevation models. In the first step, phase congruency is used to obtain an initial edge map, which is then processed in a second step by a modified ridge-detection algorithm in order to obtain an increased edge localization.

Published in:

Computational Cybernetics and Technical Informatics (ICCC-CONTI), 2010 International Joint Conference on

Date of Conference:

27-29 May 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.