Referenced Items are not available for this document.
To investigate coplanar waveguide (CPW) attenuation in monolithic microwave integrated circuits, measurements are carried out within 15-26 GHz on several CPW resonators with different metal thicknesses ranging from 200 to 2300 nm. In these experiments, the thin metal layers are made of aluminum. We will present a method for extracting the quality factor from the measured S-parameters of the CPW resonators.
Published in:
Electron Devices, IEEE Transactions on
(Volume:57
,
Issue:
8
)
Date of Publication: Aug. 2010
- Page(s):
- 2037 - 2040
- ISSN :
- 0018-9383
- INSPEC Accession Number:
- 11433082
- Digital Object Identifier :
- 10.1109/TED.2010.2050110
- Product Type:
- Journals & Magazines
- Date of Publication :
- 21 June 2010
- Date of Current Version :
- 23 July 2010
- Issue Date :
- Aug. 2010
- Sponsored by :
- IEEE Electron Devices Society
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