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Terahertz Frequency Metrology Based on Frequency Comb

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6 Author(s)
Yasui, T. ; Grad. Sch. of Eng. Sci., Osaka Univ., Toyonaka, Japan ; Yokoyama, S. ; Inaba, H. ; Minoshima, Kaoru
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Two techniques for terahertz (THz) frequency metrology based on frequency comb, namely, a THz-comb-referenced spectrum analyzer and a continuously tunable, single-frequency continuous-wave (CW)-THz generator, are reviewed. Since the frequency comb enables to coherently link the frequency among microwave, optical, and THz regions, it is possible to establish the THz frequency metrology traceable to time of the SI base units. Using a THz-comb-referenced spectrum analyzer based on a stable THz comb generated in a photoconductive antenna for THz detection, the absolute frequency of CW test sources in the sub-THz and THz regions was determined at a precision of 10-11. Furthermore, a continuously tunable, single-frequency CW-THz generator was demonstrated around 120 GHz by photomixing of an accurately tunable CW laser and a tightly fixed CW laser in the optical frequency region, phase locked to two independent optical combs. The combination of the CW-THz generator with the THz-comb-referenced spectrum analyzer will open the door for establishment of frequency metrology in the THz region.

Published in:

Selected Topics in Quantum Electronics, IEEE Journal of  (Volume:17 ,  Issue: 1 )

Date of Publication:

Jan.-Feb. 2011

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