Cart (Loading....) | Create Account
Close category search window
 

Analysis of spam mail sent to Japanese mail addresses in the long term

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Yamakawa, D. ; Dept. of Inf. & Comput. Sci., Saitama Univ., Saitama, Japan ; Yoshiura, N.

Today e-mail is a indispensable communication tool because of wide spread of Internet technology and many spam mails are delivered in the Internet. In order to avoid spam mails, spam filter is used in many mail servers or PC. It checks the content, sending address or so on of a mail and decides whether the mail is a spam mail. After spam filter works well to remove spam mails, spam senders improve the methods of sending spam. Spam filter technology and spam sending method make a vicious circle. Ending this vicious circle needs spam mail characteristics including the change according to spam filter improvement. This paper analyzes spam mails which are saved in the long term in order to obtain spam mail characteristics and reports the result of this analysis.

Published in:

Network Operations and Management Symposium (NOMS), 2010 IEEE

Date of Conference:

19-23 April 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.