Scheduled System Maintenance:
On Wednesday, July 29th, IEEE Xplore will undergo scheduled maintenance from 7:00-9:00 AM ET (11:00-13:00 UTC). During this time there may be intermittent impact on performance. We apologize for any inconvenience.
By Topic

High dynamic range imaging by varying exposure time, gain and aperture of a video camera

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Schleicher, D.C.H. ; Inst. for Meas. Technol., Johannes Kepler Univ. Linz, Linz, Austria ; Zagar, B.G.

To generate high dynamic range (HDR) images usually the exposure time is the only parameter varied when acquiring the low dynamic range (LDR) image series. In this paper the f-number and the gain of the camera are also considered to be variable as exposure defining parameter. This enables HDR imaging for image acquisition systems with limited exposure time range to prevent motion blur. The impacts of the added parameters gain and f-number are analyzed. Since common HDR image generating algorithms require the exposure time as input, an approach to estimate an equivalent exposure time by the used parameter set (exposure time, f-number and camera gain) is shown. Further this equivalent exposure time can also be estimated without a priori knowledge of the parameter set. At the end of the paper a quality assurance application is shown, where this extended parameter set was used and proved necessary for the HDR image acquisition.

Published in:

Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE

Date of Conference:

3-6 May 2010