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3 Author(s)
Dyer, R.A. ; Kansas State Univ., Manhattan, KS, USA ; Schmalzel, J.L. ; Piuri, V.

Welcome to the 2010 International Instrumentation and Measurement Technology Conference (I2MTC) and to Austin, Texas! We are thrilled to host this 27th annual gathering of engineers, scientists, business professionals and students to discuss and share what we know and are learning about the many essential fundamentals and broad applications of instrumentation and measurement. We hope that you will enjoy the educational sessions of the conference as well as the opportunity to make new acquaintances and expand your network of colleagues. This conference provides a wonderful venue for the exchange of information and the stimulation of new ideas and research initiatives. This year's conference program will certainly continue that tradition.

Published in:

Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE

Date of Conference:

3-6 May 2010