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Aliasing probability for multiple input signature analyzer

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3 Author(s)
Pradhan, D.K. ; Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA ; Gupta, S.K. ; Karpovsky, M.G.

Single and multiple multiple-input-signature-register (MISR) aliasing probability expressions are presented for arbitrary test lengths. A framework, based on algebraic codes, is developed for the analysis and synthesis of MISR-based test response compressors for BIST. This framework is used to develop closed-form expressions for the aliasing probability of MISR for arbitrary test length. An error model, based on q-ary symmetric channel, is proposed using more realistic assumptions. Results are presented that provide the weight distributions for q-ary codes (q=2m, where the circuit under test has m outputs). These results are used to compute the aliasing probability for the MISR compression technique for arbitrary test lengths. This result is extended to compression using two different MISRs. It is shown that significant improvements can be obtained by using two signature analyzers instead of one. The weight distribution of a class of codes of arbitrary length is also given

Published in:

Computers, IEEE Transactions on  (Volume:39 ,  Issue: 4 )

Date of Publication:

Apr 1990

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