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A statistical theory of digital circuit testability

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3 Author(s)
Seth, S.C. ; Dept. of Comput. Sci. & Eng., Nebraska Univ., Lincoln, NE, USA ; Agrawal, V.D. ; Farhat, H.

A relation between the average fault coverage and circuit testability is developed. The statistical formulation allows computation of coverage for deterministic and random vectors. The following applications of this analysis are discussed: determination of circuit testability from fault simulation, coverage prediction from testability analysis, prediction of test length, and test generation by fault sampling

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Computers, IEEE Transactions on  (Volume:39 ,  Issue: 4 )