Cart (Loading....) | Create Account
Close category search window
 

Voltage control devices on the IEEE 8500 node test feeder

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Schneider, K.P. ; Battelle Seattle Res. Center, Pacific Northwest Nat. Lab., Seattle, WA, USA ; Fuller, J.C.

The IEEE Test Cases provide researchers with distribution system models that can be used to validate new analytic methods. The newest of these models is the 8500-node test feeder which contains multiple devices for voltage control. In addition to a substation regulator there are multiple inline regulators as well as capacitor banks. This paper will discuss the detail in which voltage control devises should be modeled when examining large distribution systems. This discussion will include issues associated with power flow analysis for a single time step as well as for time series analysis.

Published in:

Transmission and Distribution Conference and Exposition, 2010 IEEE PES

Date of Conference:

19-22 April 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.