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Voltage control devices on the IEEE 8500 node test feeder

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2 Author(s)
Schneider, K.P. ; Battelle Seattle Res. Center, Pacific Northwest Nat. Lab., Seattle, WA, USA ; Fuller, J.C.

The IEEE Test Cases provide researchers with distribution system models that can be used to validate new analytic methods. The newest of these models is the 8500-node test feeder which contains multiple devices for voltage control. In addition to a substation regulator there are multiple inline regulators as well as capacitor banks. This paper will discuss the detail in which voltage control devises should be modeled when examining large distribution systems. This discussion will include issues associated with power flow analysis for a single time step as well as for time series analysis.

Published in:

Transmission and Distribution Conference and Exposition, 2010 IEEE PES

Date of Conference:

19-22 April 2010