By Topic

A Management Strategy for the Reliability and Performance Improvement of MLC-Based Flash-Memory Storage Systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Yuan-Hao Chang ; Dept. of Electron. Eng., Nat. Taipei Univ. of Technol., Taipei, Taiwan ; Tei-Wei Kuo

Cost has been a major driving force in the development of the flash-memory technology. Because of this, serious challenges are now faced for future products on reliability and performance requirements. In this work, we propose a management strategy to resolve the reliability and performance problems of many flash-memory products. A three-level address translation architecture with an adaptive block mapping mechanism is proposed to accelerate the address translation process with a limited amount of the RAM usage. Parallelism of operations over multiple chips is also explored with the considerations of the write constraints of advanced multilevel cell flash-memory chips. The capability of the proposed approach is analyzed with reliability considerations and evaluated by experiments over realistic workloads with respect to the reliability and performance improvement.

Published in:

Computers, IEEE Transactions on  (Volume:60 ,  Issue: 3 )