Cart (Loading....) | Create Account
Close category search window

A Unified Method for Calculating Capacitive and Resistive Coupling Exploiting Geometry Constraints on Lightly and Heavily Doped CMOS Processes

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Bontzios, Y.I. ; Dept. of Electr. & Comput. Eng., Aristotle Univ. of Thessaloniki, Thessaloniki, Greece ; Hatzopoulos, A.A.

A method for calculating capacitive and resistive coupling is developed in this work, and its implementation in commonly encountered practical cases is presented. The method is based on the geometry of the coupling mechanism, and the derived model is therefore, in general, scalable and technology independent. The constraints of any related problem can easily be incorporated into this method, whereas pure 3-D effects, such as capacitive coupling, are fast and accurately computed. The proposed method is validated using measurements from a test chip in the UMC 0.18- μm CMOS lightly doped process, simulation data obtained by two commercial simulators, and theoretical results. The accuracy of the method is shown to be within 2%-10%.

Published in:

Electron Devices, IEEE Transactions on  (Volume:57 ,  Issue: 8 )

Date of Publication:

Aug. 2010

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.