Scheduled System Maintenance on May 29th, 2015:
IEEE Xplore will be upgraded between 11:00 AM and 10:00 PM EDT. During this time there may be intermittent impact on performance. We apologize for any inconvenience.
By Topic

A Low-Voltage Energy-Sampling IR-UWB Digital Baseband Employing Quadratic Correlation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Mercier, P.P. ; Dept. of Electr. Eng. & Comput. Sci., Massachusetts Inst. of Technol. (MIT), Cambridge, MA, USA ; Bhardwaj, M. ; Daly, D.C. ; Chandrakasan, A.P.

This paper describes a digital baseband designed for use in a non-coherent IR-UWB system. Owing to the nonlinear statistics introduced by the energy-sampling RF front-end, the baseband employs a new quadratic correlation technique that achieves comparable performance to a matched filter classifier, with the added benefit of being robust to SNR estimation errors. Additionally, “alias-free codes” are introduced that allow for pulse-level synchronization accuracy without requiring any increase in front-end complexity. Fabricated in a 90 nm CMOS process, the digital baseband utilizes significant parallelism in addition to clock and data gating to achieve low-power operation, with supply voltages as low as 0.55 V. At a clock frequency of 32 MHz, the baseband requires 14-to-79 μs to process a preamble during which it consumes an average power of 1.6 mW, while payload demodulation requires 12 pJ/bit.

Published in:

Solid-State Circuits, IEEE Journal of  (Volume:45 ,  Issue: 6 )