By Topic

Corrections to “Degradation Analysis of InP Buried Heterostructure Layers in Lasers Using Optical Beam Induced Current Technique” [Mar 10 142-148]

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Tatsuya Takeshita ; NTT Photonics Laboratories, NTT Corporation, Kanagawa, Japan ; Tomonari Sato ; Manabu Mitsuhara ; Yasuhiro Kondo
more authors

In the above titled paper (ibid., vol. 10, no. 1, pp. 142-148, Mar. 10), corrections need to be made to Fig. 7(b). These are presented here. The change does not affect the results described in the paper.

Published in:

IEEE Transactions on Device and Materials Reliability  (Volume:10 ,  Issue: 2 )