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Corrections to “Degradation Analysis of InP Buried Heterostructure Layers in Lasers Using Optical Beam Induced Current Technique” [Mar 10 142-148]

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5 Author(s)
Takeshita, T. ; NTT Photonics Laboratories, NTT Corporation, Kanagawa, Japan ; Sato, T. ; Mitsuhara, M. ; Kondo, Y.
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In the above titled paper (ibid., vol. 10, no. 1, pp. 142-148, Mar. 10), corrections need to be made to Fig. 7(b). These are presented here. The change does not affect the results described in the paper.

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Device and Materials Reliability, IEEE Transactions on  (Volume:10 ,  Issue: 2 )