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A novel and efficient time-domain method is proposed to extract the equivalent circuit model of the defected ground structure. Based on time domain reflection analysis and Laplace transform, two analytical equations are derived to compute the corresponding L and C values. The non-ideal effect of the excitation source, nonzero rising time, in the TDR measurement and analysis is also considered. This method can be used to extract models for DGSs in any shape. A test sample is fabricated on FR4 substrate to verify the extracting method. The model extracted by the proposed method has a very good agreement with the simulation and measurement both in time domain and frequency domain.