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A test pattern selection method for a joint bounded-distance and encoding-based decoding algorithm of binary codes [Transactions Letters]

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3 Author(s)
Tokushige, H. ; Univ. of Tokushima, Tokushima, Japan ; Fossorier, M.P.C. ; Kasami, T.

For binary linear block codes, this letter deals with a class of decoding algorithms which utilize bounded-distance and encoding-based decodings with input sequences that are calculated from a received sequence and given test patterns. We propose a new method for selecting the test patterns by simulation. The effectiveness of the decoding algorithm whose test patterns are selected by the proposed method is also shown by simulation.

Published in:

Communications, IEEE Transactions on  (Volume:58 ,  Issue: 6 )