By Topic

Online Defects Inspection Method for Velcro Based on Image Processing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Guo-Dong Sun ; Sch. of Mech. Eng., Hubei Univ. of Technol., Wuhan, China ; Da-Xing Zhao ; Qing Lin

Quality control is a crucial issue in producing velcro, and defects existing in velcro can dramatically downgrade velcro level. Manual inspection can not meet the requirements of production efficiency, so an online feasible inspection method is referred to control the surface quality of the velcro. The original algorithm for the edge detection has been improved, and the flaws are extracted according to the first-order characteristic value. And these defects are classified according to the spectrum. Finally, the experiments have indicated that the various defects can be detected by proposed algorithm accurately, and the defects inspection method has been efficient and of great significance.

Published in:

Intelligent Systems and Applications (ISA), 2010 2nd International Workshop on

Date of Conference:

22-23 May 2010