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Modeling of injection characteristics of polar and nonpolar III-nitride multiple quantum well structures

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2 Author(s)
Kisin, Mikhail V. ; Ostendo Technologies, Inc., 6185 Paseo del Norte, Ste. 200, Carlsbad, California 92011, USA ; El-Ghoroury, H.S.

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Carrier confinement and injection characteristics of polar and nonpolar III-nitride quantum well (QW) light-emitting diode or laser diode structures are compared. We demonstrate that strongly inhomogeneous QW injection in multiple-QW (MQW) active region is one of the possible reasons holding back the advance of nonpolar laser structures. In polar structures, strong interface polarization charges induce the nonuniform carrier distribution among the active QWs so that the extreme p-side QW always dominates the optical emission. On the contrary, in nonpolar MQW structures, the inhomogeneity of QW populations is supported mainly by QW residual charges and the prevailing QW is the one closest to the n-side of the diode. For both polar and nonpolar structures, the QW injection inhomogeneity is strongly affected by the QW carrier confinement and becomes more pronounced in longer wavelength emitters with deeper active QWs. We show that in nonpolar structures indium incorporation into optical waveguide layers improves the uniformity of QW injection. On the contrary, QW injection in polar structures remains inhomogeneous even at high-indium waveguide layer compositions. We show, however, that polarization-matched design of the electron-blocking layer can noticeably improve the injection uniformity in polar MQW structure and enhance the structure internal quantum efficiency.

Published in:

Journal of Applied Physics  (Volume:107 ,  Issue: 10 )