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Too many faults, too little time on creating test sets for enhanced detection of highly critical faults and defects

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3 Author(s)
Yiwen Shi ; Div. of Eng., Brown Univ., Providence, RI, USA ; Wan-Chan Hu ; Dworak, J.

When testing resources are severely limited, special attention must be paid to critical faults so that important or frequent field failures arising from test escapes can be minimized. We present a new algorithm to optimize test sets that considers the criticality of potential undetected defects throughout the testing process and dramatically reduces the criticality of test escapes.

Published in:

VLSI Test Symposium (VTS), 2010 28th

Date of Conference:

19-22 April 2010