By Topic

Design for Testability of Analog-Digital System using Behavior Model

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Zagursky, V. ; IECS, Latvian Academy of Sciences, 14 Dzerbenes str., LV-1006, Riga, Latvia. ; Karpov, A. ; Sirovatkina, M.

The authors propose a design for testability of analog-digital systems (ADS). It is developed linear inertial heteroscedastic ADS model, that takes account of nonlinear and inertial conversion effects. The validity of the model is verified by actual measurements of the dynamic responses of a 14-bit analog-digital converter (ADC).

Published in:

Solid-State Circuits Conference, 1995. ESSCIRC '95. Twenty-first European

Date of Conference:

19-21 Sept. 1995