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Optimal Use of Junction Isolation for Photodetection in Monolithic Integrated Optoelectronic Circuits

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3 Author(s)
K. Berchtold ; AEG-Telefunken, Semiconductor Division, Heilbronn, Germany ; S. Dermitzakis ; J. Suri

The concept of optimal use of junction isolation for photodetection in integrated circuits containing a detector element and associated amplifier and logic circuits is described.

Published in:

Solid State Circuits Conference, 1976. ESSCIRC 76. 2nd European

Date of Conference:

21-24 Sept. 1976