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Statistical Modeling Techniques for thhe Simulation of Mismatch in ICs

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4 Author(s)
C. Guardiani ; SGS-Thomson Microelectronics, v.Olivetti 2, 20041 Agrate, ITALY ; R. Alini ; J. Benkoski ; G. Espinosa

An innovative technique which uses statistical modeling methods to simulate the mismatch of ICs components is presented in this paper. The proposed method is more general than previously published theories, being applicable up to very small device sizes. The present approach has been used to simulate the effect of mismatch on a complex analog circuit. Comparison with measured data confirms the accuracy and efficiency of the method.

Published in:

Solid-State Circuits Conference, 1993. ESSCIRC '93. Nineteenth European  (Volume:1 )

Date of Conference:

22-24 Sept. 1993