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Yield optimization of analog ICs using 2-step analytic modeling methods

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4 Author(s)
Carlo Guardiani ; SGS-Thomson Microelectronics, v.Olivetti 2, 20041 Agrate B.za, ITALY ; Primo Scandolara ; Jacques Benkoski ; Germano Nicollini

We applied two innovative methods for statistical design optimization in the design of a CMOS OP-AMP. The most important feature of these methods is the derivation of an analytic function representing the yield surface in the design parameters space. All the required operations are implemented in an integrated CAD system and fully automatized. The results are compared with measures on several wafer lots.

Published in:

Solid-State Circuits Conference, 1992. ESSCIRC '92. Eighteenth European

Date of Conference:

21-23 Sept. 1992