Close category search window
 

Write Failure Analysis for Bit-Patterned-Media Recording and Its Impact on Read Channel Modeling

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Zhang, Songhua ; Data Storage Inst., Agency for Sci., Technol. & Res. (A*STAR), Singapore, Singapore ; Kao-Siang Chai ; Kui Cai ; Bingjin Chen
more authors

In this paper, we present a write failure analysis for bit-patterned media recording (BPMR) with formulas derived to calculate its probability for a given set of system parameters. The write failure model derived in this work includes the effect of the recording head and media characteristics and that of a hard disk spindle motor speed variations. Such a model can help assess the performance of the writing strategy for BPMR. It is also found that since the media local parameters associated with each bit directly affect both the write failure rate and read-back signal, the read-back signal actually contains information regarding whether a bit is correctly recorded. This may be exploited by coding and detection schemes to reduce the impact of write failure on bit-error-rate performance.

Published in:
Magnetics, IEEE Transactions on  (Volume:46 ,  Issue: 6 )

Date of Publication: June 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.