By Topic

Human Factors in Large-Scale Biometric Systems: A Study of the Human Factors Related to Errors in Semiautomatic Fingerprint Biometrics

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Wertheim, K.E. ; Complete Consultants Worldwide, LLC., Bridgeport, WV, USA

The purpose of this paper is to demonstrate the importance of considering human factors in large-scale, complex biometric systems. A team of 19 board-certified latent print examiners conducted 1620 latent fingerprint image formatting tasks, 1797 encoding tasks, and 146 388 side-by-side comparison tasks of latent prints with potential matching tenprint candidates. Examiner feedback from ten encoding mistakes and 13 comparison mistakes provided significant data to demonstrate the deserved consideration of relating the Department of Defense (DoD) Human Factors Classification System (HFACS) to semiautomatic fingerprint biometrics. The increase in match rate of 10% and 7%, respectively, for encoding and comparison when verifications are conducted on these tasks provides striking evidence of the risks involved if large-scale biometric system integrators or owners design and operate biometric systems based solely on single human examiner conclusions without ample consideration of the error recovery mechanism of second-examiner involvement for low-quality data.

Published in:

Systems Journal, IEEE  (Volume:4 ,  Issue: 2 )
Biometrics Compendium, IEEE
RFIC Virtual Journal, IEEE
RFID Virtual Journal, IEEE