By Topic

Spectral Symmetry Analysis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Chertok, M. ; Sch. of Eng., Bar Han Univ., Ramat Gan, Israel ; Keller, Y.

We present a spectral approach for detecting and analyzing rotational and reflectional symmetries in n-dimensions. Our main contribution is the derivation of a symmetry detection and analysis scheme for sets of points IRn and its extension to image analysis by way of local features. Each object is represented by a set of points S ∈ IRn, where the symmetry is manifested by the multiple self-alignments of S . The alignment problem is formulated as a quadratic binary optimization problem, with an efficient solution via spectral relaxation. For symmetric objects, this results in a multiplicity of eigenvalues whose corresponding eigenvectors allow the detection and analysis of both types of symmetry. We improve the scheme's robustness by incorporating geometrical constraints into the spectral analysis. Our approach is experimentally verified by applying it to 2D and 3D synthetic objects as well as real images.

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:32 ,  Issue: 7 )