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Modeling the High-Frequency Degradation of Phase/Frequency Detectors

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2 Author(s)
Chen, R.Y. ; Dept. of Electron. Eng., Nat. Yunlin Univ. of Sci. & Technol., Doulio, Taiwan ; Zong-Yi Yang

The gain of a widely used sequential-type phase/frequency detector (PFD) as a function of its input frequency is modeled adopting a continuous-time approximation. High-frequency gain degradation is described by a frequency-dependent attenuation factor characterized in terms of the propagation delays of the PFD. The attenuation factor can be readily included in the dynamics equations of phase-locked loop to account for the effect of the PFD degradation. Gain-modeling-related delay components of a complimentary metal-oxide-semiconductor PFD are also described. The high-frequency model is in good agreement with the simulation results of the PFD.

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Circuits and Systems II: Express Briefs, IEEE Transactions on  (Volume:57 ,  Issue: 5 )