Close category search window
 

Curved surface reconstruction using a simple structured light method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Tsorng-Lin Chia ; Dept. of Electr. Eng., Chung Cheng Inst. of Technol., Taoyuan, Taiwan ; Zen Chen ; Chaur-Jou Yueh

In the conventional structured light approach to 3D object surface reconstruction, it is well known that finding the correspondences between the camera rays and light rays is a difficult problem. In this research we present a novel approach that does not directly use the ray correspondences to derive the surface points as the intersection of the corresponding camera rays and light rays. Instead, we use a virtual linear grid line originating at a grid junction on the object surface being considered. The length and the orientation of the virtual linear grid line in the 3D space are first calculated. Then the 3D positions of the grid junction can be determined. Detailed derivations and experimental results using the real object data are reported

Published in:
Pattern Recognition, 1996., Proceedings of the 13th International Conference on  (Volume:1 )

Date of Conference: 25-29 Aug 1996

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.