Cart (Loading....) | Create Account
Close category search window
 

An efficient registration and recognition algorithm via sieve processes

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Phillips, P.J. ; US Army Res. Lab., Ft. Belvoir, VA, USA ; Junqing Huang ; Dunn, S.M.

A fundamental problem in computer vision is establishing correspondence between features in two images of the same scene. The computational burden in this problem is solving for the optimal mapping and transformation between the two scenes. In this paper we present a sieve algorithm for efficiently estimating the transformation and correspondence. A sieve algorithm uses approximations to generate a sequence of increasingly accurate estimates of the correspondence. Initially, the approximations are computationally inexpensive and are designed to quickly sieve through the space of possible solutions. As the space of possible solutions shrinks, greater accuracy is required and the complexity of the approximations increases

Published in:

Pattern Recognition, 1996., Proceedings of the 13th International Conference on  (Volume:1 )

Date of Conference:

25-29 Aug 1996

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.