Cart (Loading....) | Create Account
Close category search window
 

Detection of Type-1 and Type-2 Code Clones Using Textual Analysis and Metrics

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Kodhai, E. ; Dept. of IT, SMVEC, Puducherry, India ; Kanmani, S. ; Kamatchi, A. ; Radhika, R.
more authors

Clone Detection has considerably evolved over the last decade, leading to approaches with better results but with increasing complexity. Most of the existing approaches are limited to finding program fragments similar in their syntax or semantics, while the fraction of candidates that are actually clones and fraction of actual clones identified as candidates on the average remain similar. In this paper, a metric-based approach combined with the textual comparison of the source code for the detection of functional Clones in C source code has been proposed. Various metrics had been formulated and their values were utilized during the detection process. Compared to the other approaches, this method is considered to be the least complex and is to provide a more accurate and efficient way of Clone Detection. The results obtained had been compared with the two other existing tools for the open source project Weltab.

Published in:

Recent Trends in Information, Telecommunication and Computing (ITC), 2010 International Conference on

Date of Conference:

12-13 March 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.