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Statistical SRAM analysis for yield enhancement

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5 Author(s)
Zuber, P. ; Digital Components, IMEC-Belgium, Belgium ; Miranda, M. ; Dobrovolny, P. ; van der Zanden, K.
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This paper presents an automated technique to perform SRAM wide statistical analysis in presence of process variability. The technique is implemented in a prototype tool and is demonstrated on several 45 and 32nm industry-grade SRAM vehicles. Selected case studies show how this approach successfully captures non-trivial statistical interactions between the cells and the periphery, which remain uncovered when only using statistical electrical simulations of the critical path or applying a digital corner approach. The presented tool provides the designer with valuable information on what performance metrics to expect, if manufactured. Since this feedback takes place in the design phase, a significant reduction in development time and cost can be achieved.

Published in:

Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010

Date of Conference:

8-12 March 2010