Cart (Loading....) | Create Account
Close category search window
 

Ultrafast electron beam imaging of femtosecond laser-induced plasma dynamics

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

9 Author(s)
Li, Junjie ; Physics Department and National High Magnetic Field Laboratory, Florida State University, Tallahassee, Florida 32310, USA ; Wang, Xuan ; Chen, Zhaoyang ; Clinite, Richard
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3380846 

Plasma dynamics in the early stage of laser ablation of a copper target are investigated in real time by making ultrafast electron shadow images and electron deflectometry measurements. These complementary techniques provide both a global view and a local perspective of the associated transient electric field and charge expansion dynamics. The results reveal that the charge cloud above the target surface is composed predominantly of thermally ejected electrons and that it is self-expanding, with a fast front-layer speed exceeding 107 m/s. The average electric field strength of the charge cloud induced by a pump fluence of 2.2 J/cm2 is estimated to be ∼2.4×105 V/m.

Published in:

Journal of Applied Physics  (Volume:107 ,  Issue: 8 )

Date of Publication:

Apr 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.