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A new approach is proposed to test the efficiency of methods, such as the Kalman filter and the independent component analysis (ICA), when applied to remove the artifacts induced by transcranial magnetic stimulation (TMS) from electroencephalography (EEG). By using EEG recordings corrupted by TMS induction, the shape of the artifacts is approximately described with a model based on an equivalent circuit simulation. These modeled artifacts are subsequently added to other EEG signals—this time not influenced by TMS. The resulting signals prove of interest since we also know their form without the pseudo-TMS artifacts. Therefore, they enable us to use a fit test to compare the signals we obtain after removing the artifacts with the original signals. This efficiency test turned out very useful in comparing the methods between them, as well as in determining the parameters of the filtering that give satisfactory results with the automatic ICA.