Cart (Loading....) | Create Account
Close category search window
 

Investigation of the voltage of arc ignition between vacuum interrupter contacts after the arcing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Chulkov, V.V. ; Electrotech. Inst., Acad. of Sci., Moscow, Russia ; Pertsev, A.A.

We have investigated the arcing and dielectric recovery phenomena in a vacuum interrupter (VI) theoretically and experimentally. The measurement of discharge ignition voltage after high-current arc has been made. The Monte-Carlo technique is used to study the vacuum breakdown after arcing by computer simulation. It is assumed that cathodic processes lead to emission of metal vapor into the discharge gap and electrical breakdown vacuum gap proceeds by Townsend mechanism. Because of the absence of any data for second Townsend coefficient for the copper ion, the calculation of absolute value of ignition voltage was made possible by calibrating the result by the experimental value at minimum Paschen curve

Published in:

Discharges and Electrical Insulation in Vacuum, 1996. Proceedings. ISDEIV., XVIIth International Symposium on  (Volume:1 )

Date of Conference:

21-26 Jul 1996

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.