By Topic

Performance Test of TFKO2 Qualification Sample of ITER TF Conductor

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Dong Keun Oh ; Nat. Fusion Res. Center, Daejeon, South Korea ; Soo-Hyeon Park ; Keeman Kim ; Bruzzone, P.

According to the pre-qualification program for the production of Korean conductor for ITER TF magnet, a CICC(Cable In Conduit Conductor) sample for SULTAN test was developed based on the ??Option 2?? specification which is the improved one among the two established baseline designs. For the assessment of performance, SULTAN test of the conductor sample was carried out in CRPP employing recently updated instrumentations on the sample and the joint of two conductor pieces, which has been discussed and modified for the proper estimation of . As a course of the analysis, the assessment of values was presented using the basic protocol of data reduction, and the discussion was made on the standard process of analysis. In addition, we investigated some exposed problems in the data manipulation such as non-linear voltage slopes being possible to be related to conductor characteristic itself and the initial offset problem in the calorimetric method. On the presentation of the test results, we also report the manufacture of the conductor with the qualification of the components including carefully designed Nb3Sn internal-tin superconducting strands for an improvement of conductor performance.

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:20 ,  Issue: 3 )