Cart (Loading....) | Create Account
Close category search window

Detecting defects in outdoor non-ceramic insulators using near-field microwave non-destructive testing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Qaddoumi, N. ; Dept. of Electr. Eng., American Univ. of Sharjah, Sharjah, United Arab Emirates ; El-Hag, A.H. ; Hosani, M. ; Mansouri, I.
more authors

This paper presents a novel near-field microwave nondestructive testing technique for defect detection in non-ceramic insulators (NCI). In this work, distribution class 33 kV NCI samples with no defects, air voids in silicone rubber, cracks in the fiberglass core and small metallic inclusion between the fiber core and shank were inspected. The microwave inspection system utilizes an open-ended rectangular waveguide sensor operating in the near-field at a frequency of 24 GHz. The used inspection system is simple, safe and relatively inexpensive. A data acquisition system was used to record the measured data. The results showed that all defects were repeatedly detected with high sensitivity. Line scans of the samples were obtained revealing the presence of different defects and their location. The technique also demonstrated ability to detect thickness variations in the silicon rubber shank.

Published in:

Dielectrics and Electrical Insulation, IEEE Transactions on  (Volume:17 ,  Issue: 2 )

Date of Publication:

April 2010

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.