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Error analysis for refractive-index profile determination from near-field measurements

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4 Author(s)
Helms, J. ; Inst. fuer Hochfrequenztech., Berlin, West Germany ; Schmidtchen, J. ; Schuppert, Bernd ; Petermann, K.

Refractive-index profiles of diffused optical waveguides are determined by analyzing the near-field pattern of the waveguide. For this method, a computer simulation of measurement errors due to noise, quantization, defocusing, and nonlinearity of the camera system is presented by using data of a typical camera measurement system. The simulation procedure includes signal processing of the measurement intensity profile by means of a cubic spline approximation in order to reduce the influence of the measurement system errors. The residual errors associated with this technique are on the order of a few percent when measuring typical Ti:LiNbO3 waveguides

Published in:

Lightwave Technology, Journal of  (Volume:8 ,  Issue: 5 )

Date of Publication:

May 1990

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