By Topic

Optical Characterization of Bending Efficiency in On-Chip Hollow-Core Bragg Waveguides at \lambda = 1.5  \mu m

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Thomas C. Shen ; Future Chips Constellation and the Department of Physics, Applied Physics and Astronomy, Rensselaer Polytechnic Institute, Troy, New York, USA ; Yong Sung Kim ; James A. Bur ; Shawn-Yu Lin

We present an experimental demonstration of high bending efficiency in on-chip hollow core of Bragg waveguides. Laser light in the wavelength range 1260-1630 nm is coupled into the hollow core of Bragg waveguides made of alternating silicon and silicon dioxide layers, and the transmission intensity of straight waveguides and waveguides with two bends are compared. Guiding by both types of waveguides is observed over a wide range of (nm).

Published in:

Journal of Lightwave Technology  (Volume:28 ,  Issue: 11 )