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Optical Characterization of Bending Efficiency in On-Chip Hollow-Core Bragg Waveguides at \lambda = 1.5  \mu m

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4 Author(s)
Shen, T.C. ; Future Chips Constellation & the Dept. of Phys., Rensselaer Polytech. Inst., Troy, NY, USA ; Yong Sung Kim ; Bur, J.A. ; Lin, Shawn-Yu

We present an experimental demonstration of high bending efficiency in on-chip hollow core of Bragg waveguides. Laser light in the wavelength range 1260-1630 nm is coupled into the hollow core of Bragg waveguides made of alternating silicon and silicon dioxide layers, and the transmission intensity of straight waveguides and waveguides with two bends are compared. Guiding by both types of waveguides is observed over a wide range of (nm).

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Lightwave Technology, Journal of  (Volume:28 ,  Issue: 11 )