System Notification:
We are currently experiencing intermittent issues impacting performance. We apologize for the inconvenience.
By Topic

Circular self-test path for FSMs

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Corno, F. ; Dipartimento di Autom. e Inf., Politecnico di Torino, Italy ; Prinetto, P. ; Reorda, M.S.

Circular self test path (CSTP) is an attractive method for automatically transforming sequential circuits generated by automatic synthesis tools into BIST structures. The authors extend this method-making it more suitable for FSMs derived from synthesized control parts-and are integrating it into an industrial design flow supporting testable synthesis. The CSTP approach provides good results in terms of test length and fault coverage in large circuits. It requires substitution of all or some of the flip-flops in the circuit with special cells and their connection to constitute a circular chain. CSTP also has application in industrial environments, and several commercial CAE environments, such as that used by AT&T, now support CSTP as an approach for automatic introduction of BIST in circuits

Published in:

Design & Test of Computers, IEEE  (Volume:13 ,  Issue: 4 )