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BIST for D/A and A/D converters

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3 Author(s)
Arabi, K. ; Dept. of Electr. & Comput. Eng., Ecole Polytech., Montreal, Que., Canada ; Kaminska, B. ; Rzeszut, J.

The expense of specialized equipment can be a problem in testing high resolution D/A converters. A BIST alternative that tests offset voltage, integral nonlinearity, differential nonlinearity, and gain error without such equipment or the use of a digital signal processor or microcontroller shows promise. We also extend the same technique to test a wide range of A/D converters

Published in:

Design & Test of Computers, IEEE  (Volume:13 ,  Issue: 4 )